By A. Modinos

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**Extra resources for Field, Thermionic, and Secondary Electron Emission Spectroscopy**

**Example text**

Apart from the statistical limitation given by Eq. 13), there exists another limitation to the resolution of a field emission microscope due to Heisenberg's uncertainty principle which states that, if an electron originates from a region of width 00, it must by necessity have a minimum transverse velocity Ut h/ (2moo), which thus puts an intrinsic limit to the resolution of any electron microscope. However, when this factor is taken into account, the resulting estimate for the resolution is not significantly different from that given by Eq.

4 A Richardson plot. 2. We see that only in the case of the (tOO) plane are the results very different. This may be partly due to the non-free-electron character in the field emission energy distribution from this plane (see Fig. 1 have been calculated. An interesting feature of the tungsten results is the fact that for some planes the temperature coefficient of the work function is positive and for others negative, in contrast to the copper results, where this coefficient is negative for every plane.

78) in the latter equation suggests a small nonperiodic deviation from the Schottky line proportional to F3/2. The failure of Eq. 70) to predict any periodic deviations from the Schottky line is due to our approximate treatment of the transmission probability [Eq. 32)]. which, as we have already pointed out, fails to take into account the partial reflection of the electron in the immediate vicinity of the metal-vacuum interface. It does not necessarily imply a failure of the free-electron theory.